The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Jul. 02, 2015
Applicant:

Symantec Corporation, Mountain View, CA (US);

Inventors:

Adam Jackson, San Francisco, CA (US);

Peter Lin, San Ramon, CA (US);

Jeremy Mailen, San Francisco, CA (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/62 (2013.01); H04L 29/06 (2006.01); G06F 21/55 (2013.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/556 (2013.01); G06F 21/6245 (2013.01); H04L 41/0604 (2013.01); H04L 63/20 (2013.01); G06F 2221/034 (2013.01);
Abstract

A method for calculating a partial risk score for a data object may include identifying a request to calculate a partial risk score for a data object, the request including a partial risk score filter, and the data object being associated with one or more policies. The method may further include for each policy associated with the data object, determining whether characteristics associated with the policy match a parameter in the partial risk score filter, and when the characteristics associated with the policy match information in the partial risk score filter, including a data object risk score associated with the policy in the partial risk score for the data object.


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