The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Aug. 20, 2015
Pmc-sierra Us, Inc., Sunnyvale, CA (US);
Theodore Wilson, Vancouver, CA;
Microsemi Storage Solutions (U.S.), Inc., Aliso Viejo, CA (US);
Abstract
An apparatus for monitoring operation of a design under test (DUT) comprises a plurality of inputs comprising: an incoming clock edge input connected to detect active clock edges provided to a monitored clock gate; an outgoing clock edge input connected to detect active clock edges sent from the monitored clock gate; an enable input connected to detect enable signals provided to the monitored clock gate and any leaf clock gates connected to receive clock edges through the monitored clock gate; and a protocol input connected to receive protocol signals specifying when the monitored clock gate is required to output active clock edges. The apparatus also comprises a memory in communication with the inputs for storing values from the inputs, and a processor in communication with the memory and the inputs, the processor programmed to determine protocol compliance and to calculate energy consequences of dropping of active clock edges.