The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Aug. 30, 2013
Applicants:
Xuefei Guan, Princeton, NJ (US);
Jingdan Zhang, Plainsboro, NJ (US);
Shaohua Kevin Zhou, Plainsboro, NJ (US);
Inventors:
Xuefei Guan, Princeton, NJ (US);
Jingdan Zhang, Plainsboro, NJ (US);
Shaohua Kevin Zhou, Plainsboro, NJ (US);
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/10 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G06F 2217/10 (2013.01); G06F 2217/76 (2013.01);
Abstract
A method for predicting fatigue crack growth in materials includes providing a prior distribution obtained using response measures from one or more target components using a fatigue crack growth model as a constraint function, receiving new crack length measurements, providing a posterior distribution obtained using the new crack length measurements, and sampling the posterior distribution to obtain crack length measurement predictions.