The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Oct. 12, 2016
Semmle Limited, Oxford, GB;
Sebastiaan Johannes van Schaik, Oxford, GB;
Stephen Philip Buckley, Oxford, GB;
Yorck Huenke, Oxford, GB;
Semmle Limited, Oxford, GB;
Abstract
Methods, systems, and apparatus, including computer programs encoded on computer storage media, for generating widened types for computing measures of rework normalized churn. One of the methods includes determining a plurality of commit chains for a software developer. Respective measures of rework churn occurring in each commit chain are calculated. An overall rework factor is computed for the developer using the respective measures of rework churn for each commit chain in the plurality of commit chains for the developer. A measure of rework normalized churn is computed for the developer including adjusting the initial measure of churn by the overall rework factor. Productivity of the developer is quantified relative to one or more other developers using the measure of rework normalized churn for the developer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile