The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Jun. 25, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Ying Chen Lou, Escondido, CA (US);

Hengzhou Ding, San Diego, CA (US);

Ruben Manuel Velarde, Chula Vista, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/486 (2006.01); G01S 17/89 (2006.01); G01S 7/497 (2006.01); G01S 17/08 (2006.01); H04N 5/232 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4865 (2013.01); G01S 7/4868 (2013.01); G01S 7/497 (2013.01); G01S 17/08 (2013.01); G01S 17/89 (2013.01); H04N 5/2353 (2013.01); H04N 5/23212 (2013.01);
Abstract

This application relates to capturing an image of a target object using information from a time-of-flight sensor. In one aspect, a method may include a time-of-flight (TOF) system configured to emit light and sense a reflection of the emitted light and may determine a return energy based on the reflection of the emitted light. The method may measure a time between when the light is emitted and when the reflection is sensed and may determine a distance between the target object and the TOF system based on that time. The method may also identify a reflectance of the target object based on the return energy and may determine an exposure level based on a distance between the target object and a reflectance of the target object.


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