The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Jan. 13, 2011
Applicants:

Tobias Ratko Voigt, London, GB;

Ulrich Katscher, Norderstedt, DE;

Thomas Hendrik Rozijn, Eindhoven, NL;

Paul Royston Harvey, Eindhoven, NL;

Hanno Homann, Hamburg, DE;

Christian Findeklee, Norderstedt, DE;

Eberhard Sebastian Hansis, Menlo Park, CA (US);

Inventors:

Tobias Ratko Voigt, London, GB;

Ulrich Katscher, Norderstedt, DE;

Thomas Hendrik Rozijn, Eindhoven, NL;

Paul Royston Harvey, Eindhoven, NL;

Hanno Homann, Hamburg, DE;

Christian Findeklee, Norderstedt, DE;

Eberhard Sebastian Hansis, Menlo Park, CA (US);

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/54 (2006.01); G01R 33/341 (2006.01); G01R 33/48 (2006.01); A61B 5/053 (2006.01); A61B 5/055 (2006.01); G01R 33/24 (2006.01); G01R 33/44 (2006.01);
U.S. Cl.
CPC ...
G01R 33/48 (2013.01); A61B 5/055 (2013.01); A61B 5/0536 (2013.01); G01R 33/246 (2013.01); G01R 33/443 (2013.01);
Abstract

A magnetic resonance method of electric properties tomography imaging of an object includes applying an excitation RF field to the object via a coil at a first spatial coil position (), acquiring resulting magnetic resonance signals via a receiving channel from the object, determining from the acquired magnetic resonance signals a first phase distribution and a first amplitude of a given magnetic field component of the excitation RF field of the coil at the first coil position (), repeating these steps with a coil at a second different spatial coil position (), to obtain a second phase distribution, determining a phase difference between the first and second phase distribution, determining a first and a second complex permittivity of the object, the first complex permittivity comprising the first amplitude of the given magnetic field component and the second complex permittivity comprising the second amplitude of the given magnetic field component and the phase difference, equating the first complex permittivity and the second complex permittivity for receiving a final equation and determining from the final equation a phase of the given magnetic field component for the first coil position ().


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