The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Sep. 17, 2014
Applicant:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Inventors:

Takaaki Nagai, Kobe, JP;

Yuichi Hamada, Kobe, JP;

Masaharu Shibata, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe-Shi, Hyogo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); G01N 35/02 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/026 (2013.01); G01N 35/0092 (2013.01); G01N 35/0095 (2013.01); G01N 2035/00326 (2013.01); G01N 2035/0412 (2013.01); G01N 2035/0484 (2013.01); Y10T 436/114165 (2015.01);
Abstract

This analysis apparatus includes a transporter transporting the specimens to the first measurement unit and the second measurement unit, and a control portion so controlling the transporter as to transport a first specimen container, stored in the rack, storing a first specimen to the first measurement unit and as to transport a second specimen container, stored in the rack along with the first specimen container, storing a second specimen to the second measurement unit.


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