The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Nov. 04, 2014
Fbs, Inc., Bellefonte, PA (US);
Cody Borigo, Pennsylvania Furnace, PA (US);
Steven E. Owens, Bellefonte, PA (US);
Joseph L. Rose, State College, PA (US);
FBS, Inc., Bellefonte, PA (US);
Abstract
A method for ultrasonic guided wave defect detection in a structure is disclosed. The method includes driving a plurality of transducers to cause guided waves to be transmitted in the structure in a predetermined direction or focused at a predetermined focal point, receiving at least one reflected guided wave signal, and generating image data of the structure based on the at least one reflected guided wave signal. Processed image data are generated by performing at least one of baseline image subtraction or image suppression on the image data, and a location of at least one possible defect in the structure is identified based on the processed image data.