The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Nov. 29, 2013
Horiba Jobin Yvon Sas, Longjumeau, FR;
Olivier Acher, Gif sur Yvette, FR;
Simon Richard, Villebon sur Yvette, FR;
Christian Brach, Saint Arnoult en Yvelines, FR;
Viviane Millet, Linas, FR;
Sebastien Corde, Paris, FR;
Daphne Heran, Montrouge, FR;
HORIBA JOBIN YVON SAS, Longjumeau, FR;
Abstract
A spectrometer () for analyzing the spectrum of an upstream light beam (), includes an entrance slit () and collimating elements () suitable for generating, from the upstream light beam, a collimated light beam (), characterized in that it also includes: a polarization-dependent diffraction grating () suitable for diffracting, at each wavelength () of the spectrum of the upstream light beam, the collimated light beam into a first diffracted light beam () and a second diffracted light beam (); optical recombining elements () including a planar optical reflecting surface () perpendicular to the grating and suitable for deviating at least the second diffracted light beam; and focussing elements () suitable for focussing, at each wavelength, the first diffracted light beam and the second diffracted light beam onto one and the same focussing area ().