The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Jun. 10, 2011
Applicant:
Darryl J. Bornhop, Nashville, TN (US);
Inventor:
Darryl J. Bornhop, Nashville, TN (US);
Assignee:
Vanderbilt University, Nashville, TN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); G01N 21/45 (2006.01); G01N 21/05 (2006.01); G01N 21/552 (2014.01); G01N 21/65 (2006.01); G01N 21/47 (2006.01); G01N 21/77 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 21/05 (2013.01); G01N 21/553 (2013.01); G01N 21/658 (2013.01); G01N 2021/0346 (2013.01); G01N 2021/4709 (2013.01); G01N 2021/7776 (2013.01);
Abstract
Disclosed are improved optical detection systems and methods comprising multiplexed interferometric detection systems and methods for determining a characteristic property of a sample, together with various applications of the disclosed techniques.
Bornhop, Darryl. (2017). Multiplexed interferometric detection system and method (U.S. Patent No. 9638632). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9638632
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile