The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Apr. 15, 2015
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Tomohiro Yamauchi, Kawasaki, JP;

Shoichiro Oda, Fuchu, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G01J 1/04 (2006.01); H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01J 1/0488 (2013.01); H04B 10/07953 (2013.01); G01J 2001/444 (2013.01);
Abstract

There is provided a measurement apparatus of measuring signal light quality. The measurement apparatus may include: a tunable wavelength filter configured to be input signal lights having different power levels; a measure configured to measure an optical power level of light passing through the tunable wavelength filter; and a controller configured to calculate a non-linear noise component and a spontaneous emission component of a signal light based on the measured optical power levels, the optical power levels being measured at different transmission frequencies for each of the signal lights having the different power levels in response to a control of the transmission frequency of the tunable wavelength filter.


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