The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Apr. 04, 2014
Leica Geosystems Ag, Heerbrugg, CH;
Hans-Martin Zogg, Uttwil, CH;
Patrik Lengweiler, Maienfeld, CH;
Robert Natau, St. Gallen, CH;
Reto Stutz, Berneck, CH;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A total station including an electro-optical distance measuring unit and a scanning functionality is disclosed. The total station may include an analysis unit for analysis of the registered measuring signal data and conversion thereof into scanning points for a point cloud, whereby a point cloud having the scanning points can be generated. The distance measuring unit may be configured in such a manner that the distance measurement can be carried out by means of runtime measurement and/or waveform digitizing (WFD). In addition, the total station may have a program storage unit which may provide at least two scanning modes, wherein the at least two scanning modes differ at least in a measuring rate such as, for example, in the number of scanning points per unit of time.