The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Dec. 21, 2015
Dr. Johannes Heidenhain Gmbh, Traunreut, DE;
Walter Huber, Traunstein, DE;
DR. JOHANNES HEIDENHAIN GMBH, Traunreut, DE;
Abstract
An optical position-measuring device senses a relative position of two objects. A reflection material measure is connected to one object and a scanning unit is connected to the other object. A beam is split into three sub-beams in a first splitting plane by a first splitting element. The first and third sub-beams are deflected toward the reflection material measure by the deflecting elements, while the second sub-beam is split into fourth and fifth sub-beams by a second splitting element. The first and fourth sub-beams propagate as a first pair of superimposed sub-beams and the third and fifth sub-beams propagate as a second pair of superimposed sub-beams. The first and second pairs of superimposed sub-beams, after being reflected by the reflection material measure, propagate respectively toward detectors, where the sub-beams in each pair are brought into interfering superposition, so that the detectors detect displacement-dependent scanning signals.