The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
May. 06, 2013
University of Washington Through Its Center for Commercialization, Seattle, WA (US);
Joan E. Sanders, Sammamish, WA (US);
Michael R. Severance, Seattle, WA (US);
Katheryn J. Allyn, Seattle, WA (US);
University of Washington, Seattle, WA (US);
Abstract
Systems, methods, and software are provided for assessing manufacturing errors of a prosthetic socket to facilitate a clinical assessment of the socket. The embodiments disclosed herein may align and compare a manufactured socket shape to a desired socket shape to determine whether clinically significant errors are present in the manufactured socket. A mean radial error (MRE) may be calculated and compared to a set threshold. If the MRE falls below the threshold an interquartile range (IQR) may be calculated and compared to an IQR threshold. If the IQR falls below the IQR threshold, surface normal angle errors (SNAE) may be calculated and plotted to the surface model. If the SNAE plot does not include closed contour regions, the socket may proceed to patient fitting. If the MRE or IQR thresholds are exceeded, or if the SNAE plot indicates closed contour regions, the socket may be reshaped accordingly, prior to fitting.