The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Aug. 06, 2013
Applicant:

The University of North Carolina AT Chapel Hill, Chapel Hill, NC (US);

Inventors:

Huai-Ping Lee, Plantation, FL (US);

Mark Stephen Foskey, Chapel Hill, NC (US);

Marc Niethammer, Carrboro, NC (US);

Ming Lin, Chapel Hill, NC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/06 (2006.01); A61B 6/00 (2006.01); G06T 19/20 (2011.01); G06T 7/00 (2017.01); A61B 6/03 (2006.01); G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
A61B 6/5217 (2013.01); A61B 6/032 (2013.01); A61B 6/466 (2013.01); A61B 6/50 (2013.01); G06T 7/0012 (2013.01); G06T 7/0032 (2013.01); G06T 15/00 (2013.01); G06T 19/20 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/30081 (2013.01); G06T 2210/41 (2013.01); G06T 2219/2021 (2013.01);
Abstract

Simulation-based estimation of elasticity parameters and use of same for non-invasive cancer detection and cancer staging are disclosed. According to one aspect, a method for simulation-based estimation of elasticity parameters includes constructing a 3D model of an object comprising biological tissue, the model having a first shape and an elasticity value. A simulation iteration is then performed, which includes simulating the application of an external force to the model, causing the model to have a second shape, measuring the difference between the second shape and a target shape, and determining whether the measured difference between the second shape and the target shape is within a threshold of error. If the measured difference is not within the threshold of error, the process performs additional iterations using adjusted elasticity or force values until the measured difference is within the threshold of error, at which time the final elasticity and force values are reported. In one embodiment, the elasticity value is mapped to a diagnostic parameter, such as an indication of the possibility, presence, or stage of cancer.


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