The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Jul. 06, 2009
Applicant:

Uri Tasch, Baltimore, MD (US);

Inventor:

Uri Tasch, Baltimore, MD (US);

Assignee:

Step Analysis LLC, Baltimore, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1038 (2013.01);
Abstract

A system and method for measuring and analyzing locomotion is provided. The system may include a gait analysis apparatus that is configured to provide multi-dimensional measurements of the gait of an individual as the individual traverses the apparatus. The multiple dimensions may include force, space, time, and frequency. The gait analysis apparatus may be configured to provide a gait measurement processing device with the multi-dimensional measurements. Based on the multi-dimensional measurements, the gait measurement processing device may, for example, diagnose the test subject with a particular NM disease and/or injury, monitor progression of the particular NM disease and/or injury over time, and determine which measurements may be used as biomarkers to identify the particular NM disease and/or injury.


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