The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Nov. 27, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Ryuichi Nanaumi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 8/00 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0095 (2013.01); A61B 8/4209 (2013.01); A61B 8/5207 (2013.01); A61B 5/7239 (2013.01); A61B 8/0825 (2013.01); A61B 8/485 (2013.01);
Abstract

A subject information acquisition device includes an elastic wave receiving unit configured to receive elastic waves generated inside a subject and output a reception signal; and a signal processing unit configured to acquire subject information in an interest region of the subject, on the basis of the reception signal. In measurement states, the elastic wave receiving unit receives elastic waves and outputs reception signals corresponding to the measurement states. The signal processing unit corrects the reception signals by weighting factors based on measurement parameters in the measurement states, and acquires corrected reception signals in the interest region corresponding to the measurement states. The signal processing unit acquires the subject information in the interest region, on the basis of the sum of the corrected reception signals and the sum of the weighting factors.


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