The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Apr. 06, 2015
Applicant:

Korea Electronics Technology Institute, Gyeonggi-do, KR;

Inventors:

Tai Gil Kwon, Goyang-si, KR;

Jin Woong Cho, Seoul, KR;

Yong Seong Kim, Goyang-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 84/20 (2009.01); H04W 24/06 (2009.01); H04W 76/04 (2009.01); H04W 40/24 (2009.01);
U.S. Cl.
CPC ...
H04W 76/045 (2013.01); H04W 40/244 (2013.01); H04W 84/20 (2013.01);
Abstract

Provided is a method for determining network link quality between a master station and slave stations in a wireless network system having a synchronous superframe structure. The method for determining link quality in a wireless network system includes determining whether the current station is a master or a slave, when the current station is a master, comparing a time value during which the latest packets were received from slaves and a maximum time value during which the slaves are not obliged to exchange packets with the master after accessing a network, and determining link quality between the slaves and the master according to the comparison result.


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