The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Mar. 28, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Ki-Beom Park, Hwaseong-si, KR;

Hyun-Woo Jang, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); H04W 24/08 (2009.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04L 41/5009 (2013.01); H04L 41/5038 (2013.01); H04L 43/10 (2013.01); H04L 41/0213 (2013.01); H04L 41/06 (2013.01); H04L 43/087 (2013.01); H04L 43/0811 (2013.01); H04L 43/0817 (2013.01); H04L 43/0829 (2013.01); H04L 43/0852 (2013.01); H04L 43/0858 (2013.01); H04L 43/0864 (2013.01); H04L 43/0888 (2013.01); H04L 43/106 (2013.01);
Abstract

An operation method and apparatus in a first end device of a service provider network is provided. The method includes generating a measurement frame including information supporting simultaneous measurement of a plurality of Service Level Agreement (SLA) metrics, sending the generated measurement frame to a second end device connected through the service provider network, receiving a reply frame corresponding to the generated measurement frame from the second end device, and analyzing the received reply frame and hierarchically acquiring the plurality of SLA metrics for the second end device.


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