The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Oct. 24, 2016
Keysight Technologies, Inc., Minneapolis, MN (US);
Sourja Ray, Cupertino, CA (US);
Brian D. Setterberg, Menlo Park, CA (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A system and method for detecting and correcting large errors during ADC operation. The system includes an ADC; an AAF at the input of the ADC, having bandwidth less than information bandwidth of the ADC; and a large-error detection and correction processing unit at the output of the ADC. The large-error detection and correction circuit includes an interpolation filter to determine values of predicted digital samples corresponding to actual digital samples in a sequence of digital samples from the ADC based on information from neighboring digital samples. A signal-delay circuit in parallel with the interpolation filter delays the actual digital samples by an amount of a lag from the interpolation filter. An adder determines differences between the predicted and actual digital samples, a matched filter detects a pattern of the differences, and a large-error detection processing unit determines whether a large error occurs based on the pattern of the differences.