The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Nov. 15, 2013
Applicant:

Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, CN;

Inventors:

Jehao Hsu, Shenzhen, CN;

Qibiao Lv, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01R 31/31724 (2013.01); G09G 2300/0426 (2013.01);
Abstract

A panel inspection apparatus and a display panel are provided in the present invention. The panel inspection apparatus includes a data line detecting circuit and a scan line detecting circuit. The data line detecting circuit includes a data line detection switch, a control line of the data line detection switch, and a data line of the data line detection switch. The scan line detecting circuit includes a scan line detection switch, a control line of the scan line detection switch, and a data line of the scan line detection switch. The present invention further provides a display panel. The panel inspection apparatus does not need to be removed after detection of the panel in accordance with the panel inspection apparatus and the display panel of the present invention. Therefore, production costs of the display panel are reduced, and productivity of the display panel is improved.


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