The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Dec. 19, 2014
Applicant:

Roland Dg Corporation, Hamamatsu, JP;

Inventors:

Takayuki Sakurai, Hamamatsu, JP;

Yasutoshi Nakamura, Hamamatsu, JP;

Assignee:

Roland DG Corporation, Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 15/50 (2011.01); G06T 17/20 (2006.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
G06T 15/506 (2013.01); G06T 17/20 (2013.01); G06T 19/00 (2013.01); G06T 2219/008 (2013.01);
Abstract

To make it possible to generate slice data without the need to modify a polygon mesh that does not satisfy conditions of a perfect solid model. A slice data generator for generating slice data representing a cross section cut from a three-dimensional modeled object, wherein the slice data generator has: changing means for changing topology information of a polygon mesh so that a contour polyline is obtained indicating a contour line of a cut cross section of the polygon mesh; and modifying means for acquiring the contour polyline from the polygon mesh, the topology information of the polygon mesh having been changed by the changing means, and modifying the contour polyline so that an inside which is a region inside the acquired contour polyline can be normally filled; slice data being generated on the basis of the contour polyline modified by the modifying means.


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