The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Nov. 26, 2013
Sharp Kabushiki Kaisha, Osaka-shi, Osaka, JP;
Shinichi Arita, Osaka, JP;
Sharp Kabushiki Kaisha, Sakai, JP;
Abstract
An image measurement device calculates a disparity value from image data of images having disparity, acquires three-dimensional position information at the time of capturing the image data by using the disparity value, and calculates a three-dimensional plane from a region on an image serving as a same plane as a designated measurement region. Three-dimensional positions of the measurement region are acquired from the calculated three-dimensional plane to calculate a length. Accordingly, by using captured images having disparity, it is possible to measure a length of any part even in a region that the disparity value is hard to be acquired.