The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Jun. 09, 2014
Omnivision Technologies, Inc., Santa Clara, CA (US);
Chih Poh Pang, Pleasanton, CA (US);
Haifeng Li, Sunnyvale, CA (US);
Charles Shan, San Jose, CA (US);
Tony Liu, San Jose, CA (US);
Jizhang Shan, Cupertino, CA (US);
OmniVision Technologies, Inc., Santa Clara, CA (US);
Abstract
A system for obtaining image depth information for at least one object in a scene includes (a) an imaging objective having a first portion for forming a first optical image of the scene, and a second portion for forming a second optical image of the scene, the first portion being different from the second portion, (b) an image sensor for capturing the first and second optical images and generating respective first and second electronic images therefrom, and (c) a processing module for processing the first and second electronic images to determine the depth information. A method for obtaining image depth information for at least one object in a scene includes forming first and second images of the scene, using respective first and second portions of an imaging objective, on a single image sensor, and determining the depth information from a spatial shift between the first and second images.