The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Jun. 28, 2013
Applicants:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Kagoshima University, Kagoshima-shi, JP;

Hiroshima City University, Hiroshima-shi, JP;

Inventors:

Ryusuke Sagawa, Tsukuba, JP;

Hiroshi Kawasaki, Kagoshima, JP;

Ryo Furukawa, Hiroshima, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G01B 11/25 (2006.01); G06T 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0057 (2013.01); G01B 11/2513 (2013.01); G01B 11/2545 (2013.01); G06T 1/0007 (2013.01); G06T 2207/10012 (2013.01);
Abstract

A high-density shape reconstruction is conducted in measuring animal bodies as well. An image processing system has a projection device, an imaging device, and an image processing apparatus connected to the projection device and the imaging device, wherein the projection device projects a projected pattern to an observation target, the imaging device captures the projected pattern, and the image processing apparatus performs shape reconstruction based on an input image including the projected pattern. The image processing apparatus includes a unit for fetching the input image captured by the imaging device and performing line detection for the projected pattern projected by the projection device, wherein the projected pattern is a grid pattern formed of wave lines; and a unit for performing shape reconstruction by associating intersection points of vertical and horizontal lines extracted by the line detection with the projected pattern.


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