The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Jun. 29, 2012
Applicants:

Sergey Simanovsky, Brookline, MA (US);

Ram Naidu, Newton, MA (US);

Inventors:

Sergey Simanovsky, Brookline, MA (US);

Ram Naidu, Newton, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/04 (2006.01); G06T 7/00 (2017.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); G01N 23/046 (2013.01); G01V 5/005 (2013.01); G06T 7/0004 (2013.01); G06T 7/0012 (2013.01); G06T 7/0081 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20148 (2013.01); G06T 2207/30112 (2013.01);
Abstract

Among other things, one or more systems and/or techniques for identifying an occlusion region in an image representative of an object subjected to examination is provided for herein. Such systems and/or techniques may find particular application in the context of object recognition analysis. An image is generated of the object and an orientation of the object is determined from the image. Based upon the determined orientation of the object relative to the direction the object is translated during examination, one or more parameters utilized for segmenting a second image of the object, identifying features in the image, and/or determining if the image comprises an occlusion region may be adjusted. In this way, the parameters utilized may be a function of the determined orientation of the object, which may mitigate false positives of detected occlusion regions.


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