The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Apr. 04, 2014
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Beilei Xu, Penfield, NY (US);

Yusuf O. Artan, Ankara, TR;

Peter Paul, Penfield, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2017.01); H04N 5/33 (2006.01); G08G 1/04 (2006.01); G08G 1/017 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00832 (2013.01); G06K 9/00228 (2013.01); G06K 9/00785 (2013.01); G06K 9/00838 (2013.01); G06K 9/4638 (2013.01); G06K 9/6202 (2013.01); G06K 9/6206 (2013.01); G06K 9/6267 (2013.01); G06T 7/0044 (2013.01); G06T 7/0081 (2013.01); G08G 1/0175 (2013.01); G08G 1/04 (2013.01); H04N 5/33 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20132 (2013.01); G06T 2207/30268 (2013.01);
Abstract

A system and method that includes training a classifier using uniquely defined landmark points along the windshield region based on an elastic deformation model. The deformation model uses mixtures of trees with a shared pool of parts and can be globally optimized with dynamic programming and still capture much relevant global elastic structure. Once a candidate area is identified in the scene, a learned threshold is applied to the classification score of the candidate area to determine if the candidate area is a windshield. The identified area is then cropped out for further downstream process.


Find Patent Forward Citations

Xu, Beilei. (2017). Robust windshield detection via landmark localization (U.S. Patent No. 9633267). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9633267

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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