The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Sep. 21, 2015
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Abstract
A method for face alignment operates on a face image and a set of intitial landmark locations by first aligning globally the initial locations to a set of landmark locations of a face with a prototype shape to obtain global alignment parameters, and then warping the initial locations and the image from a coordinate frame of the image to a coordinate frame of the prototype shape according to the global alignment parameters to obtain warped landmark locations and a warped face image. Features are extracted from the warped face image at the warped landmark locations, and a regression function is applied to the features to obtain updated landmark locations in the coordinate frame of the prototype shape. Finally, the updated landmark locations in the coordinate frame of the prototype shape are warped to the coordinate frame of the image, to obtain updated landmark locations.