The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Dec. 01, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jonghoon Shin, Hwaseong-si, KR;

KyoungMoon Ahn, Seoul, KR;

Mijung Noh, Yongin-si, KR;

Yong Ki Lee, Yongin-si, KR;

Sun-Soo Shin, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/31 (2013.01); G06F 21/60 (2013.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G06F 21/31 (2013.01); G01R 31/318588 (2013.01); G06F 21/602 (2013.01);
Abstract

A method of debugging a device which includes a plurality of processors is provided. The method includes verifying a request to initiate authentication that is provided to the device to a user; performing a challenge-response authentication operation between the user and the device in response to the request to initiate authentication being a request from a non-malicious user; activating or deactivating an access to a Joint Test Action Group (JTAG) port of each of the processors, based on access control information from the user; and permitting a debugging operation via an access that is activated.


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