The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Sep. 26, 2012
Oracle International Corporation, Redwood City, CA (US);
Uri Shaft, Fremont, CA (US);
Graham Stephen Wood, El Granada, CA (US);
John Beresniewicz, Half Moon Bay, CA (US);
Oracle International Corporation, Redwood City, CA (US);
Abstract
A method for determining event counts for a database system includes capturing samples for the active sessions based on a pre-defined sampling frequency and identifying events from the captured samples. The method further includes determining the wait time for each of the identified events and determining an event count for the active sessions using a harmonic mean. The harmonic mean is a summation of the maximum of either one or the ratio of the sampling frequency to the determined wait time for each of the identified events.