The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Jun. 15, 2016
International Business Machines Corporation, Armonk, NY (US);
Bruce McNutt, Tucson, AZ (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Method, system, and computer program product embodiments for facilitating deduplication product testing in a computing environment are provided. In one such embodiment, data to be processed through the deduplication product testing is arranged into a single, continuous stream. At least one of a plurality of random modifications are applied to the arranged data in a self-similar pattern exhibiting scale invariance. A plurality of randomly sized subsets of the arranged data modified with the self-similar pattern is mapped into each of a plurality of randomly sized deduplication test files which are calibrated against input/output (I/O) trace data obtained in the computing environment.