The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Sep. 21, 2012
Applicant:
Huron Technologies International Inc., Waterloo, CA;
Inventors:
Savvas Damaskinos, Kitchener, CA;
Arthur Edward Dixon, Waterloo, CA;
Assignee:
Huron Technologies International Inc., Waterloo, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/04 (2006.01); G02B 21/06 (2006.01); B82Y 35/00 (2011.01); G02B 21/00 (2006.01); G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 21/34 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); B82Y 35/00 (2013.01); G01N 21/6456 (2013.01); G02B 21/002 (2013.01); G02B 21/16 (2013.01); G02B 21/34 (2013.01); G02B 21/367 (2013.01);
Abstract
An instrument and method for scanning a large microscope specimen uses a light source and at least one lens to focus light from the specimen onto a detector array. The specimen holder is located on a scanning stage and the detector array is dynamically tilted about a scan direction during the scan to maintain focus across the width of the scan strip as the scan proceeds. A degree of tilt varies during the scan as is required to maintain lateral focus relative to the detector array.