The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Oct. 31, 2014
Applicant:

Conocophillips Company, Houston, TX (US);

Inventors:

Chengbo Li, Houston, TX (US);

Sam T. Kaplan, Oakland, CA (US);

Charles C. Mosher, Houston, TX (US);

Joel D. Brewer, Houston, TX (US);

Robert G. Keys, Houston, TX (US);

Assignee:

ConocoPhillips Company, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/00 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/30 (2013.01); G01V 1/003 (2013.01); G01V 1/36 (2013.01); G01V 2210/169 (2013.01); G01V 2210/57 (2013.01); G01V 2210/60 (2013.01); G01V 2210/614 (2013.01);
Abstract

Computer-implemented method for determining optimal sampling grid during seismic data reconstruction includes: a) constructing an optimization model, via a computing processor, given by min∥Su∥s.t. ∥Ru−b∥≦σ wherein S is a discrete transform matrix, b is seismic data on an observed grid, u is seismic data on a reconstruction grid, and matrix R is a sampling operator; b) defining mutual coherence as wherein C is a constant, S is a cardinality of Su, m is proportional to number of seismic traces on the observed grid, and n is proportional to number of seismic traces on the reconstruction grid; c) deriving a mutual coherence proxy, wherein the mutual coherence proxy is a proxy for mutual coherence when S is over-complete and wherein the mutual coherence proxy is exactly the mutual coherence when S is a Fourier transform; and d) determining a sample grid r=arg minμ(r).


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