The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Apr. 22, 2013
SE Young Kim, Daejeon, KR;
Jong Hwan Lee, Daejeon, KR;
Jin Bong Sung, Daejeon, KR;
Abstract
An apparatus for testing the performance of a synthetic aperture radar is provided. The apparatus for testing the performance of a synthetic aperture radar includes: a three-axis motion platform that is coupled to an antenna and driven in roll, pitch, and yaw directions so as to reproduce motion components generated from a pointing plane of the antenna; a target simulator configured to reproduce a ground target; and a system simulator that allows the three-axis motion platform and the target simulator to work in conjunction with each other in real time, and controls the three-axis motion platform and the target simulator. Here, the three-axis motion platform may include a three-axis driver that determines the attitude of the three-axis motion platform, based on position and speed information received from the system simulator. The target simulator may include a target modulator that adjusts the amplitude of an output signal, performs range and phase delays, and reproduces a Doppler component, based on simulation target information received from the system simulator.