The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Jun. 25, 2012
Yusuke Seki, Tokyo, JP;
Takashi Azuma, Tokyo, JP;
Yusuke Seki, Tokyo, JP;
Takashi Azuma, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A magnetic resonance measuring equipment capable of detecting a nuclear magnetic resonance signal with a higher sensitivity and a higher resolution in comparison with related magnetic resonance measuring equipment. The magnetic resonance measuring equipment modulates a nuclear magnetic resonance signal by applying a vibration (sonic wave) of a known frequency, which is higher than the frequency of the nuclear magnetic resonance signal, to an examination object, and detects the modulated signal by performing lock-in detection, which makes it possible that the magnetic resonance measuring equipment detects the nuclear magnetic resonance signal with a high sensitivity. In addition, after irradiating a local area of the object with an ultrasonic wave, and modulating the nuclear magnetic resonance signal derived from the irradiated local area, the magnetic resonance measuring equipment can detect the nuclear magnetic resonance signal with a high resolution.