The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Jun. 23, 2014
Keysight Technologies, Inc., Minneapolis, MN (US);
Loren C. Betts, Rohnert Park, CA (US);
David V. Blackham, Santa Rosa, CA (US);
Michael C. Dobbert, Santa Rosa, CA (US);
Xiaolong Li, Petaluma, CA (US);
Dara Sariaslani, Santa Rosa, CA (US);
Lisa Shenton, Santa Rosa, CA (US);
Erwin F. Siegel, Windsor, CA (US);
Bernadette Smith, Santa Rosa, CA (US);
Matt Todhunter, Santa Rosa, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A method determines operating characteristics of a signal generator. The method includes performing a first set of measurements of an output signal generated by the signal generator and corresponding reflected signal, where the first set of measurements is performed over multiple frequencies and amplitudes of the output signal; applying an external signal to the output port of the signal generator; performing a second set of measurements of the output signal and corresponding reflected signal while the external signal is being applied to the output port, where the second set of measurements is performed over frequencies and amplitudes of the output signal, the external signal having the same frequency as the output signal for each measurement of the second set of measurements. A set of coefficients describing the operating characteristics of the signal generator is determined by processing results of the first and second sets of measurements through a non-linear model.