The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Jul. 30, 2013
Applicant:

Shibuya Kogyo Co., Ltd., Ishikawa, JP;

Inventors:

Yukinobu Nishino, Ishikawa, JP;

Yuichi Takenaka, Ishikawa, JP;

Youhei Sakamoto, Ishikawa, JP;

Ryo Abe, Ishikawa, JP;

Assignee:

SHIBUYA KOGYO CO., LTD., Ishikawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 33/04 (2006.01); G01R 19/165 (2006.01); G01R 19/00 (2006.01); G21K 5/04 (2006.01);
U.S. Cl.
CPC ...
G01R 19/165 (2013.01); G01R 19/0092 (2013.01); G21K 5/04 (2013.01); H01J 33/04 (2013.01);
Abstract

An electron beam detecting device detects a state of an electron beam radiated by an electron beam radiation device. A plurality of wire electrodes, which are conductors, are disposed corresponding to a plurality of filaments, the wire electrodes being electrically insulated from each other, in the area in which the electron beams are radiated. The electrical current flowing through each of the wire electrodes is measured by an electric current measuring instrument (measuring unit). A CPU (determining unit) determines the radiation level of the electron beams by receiving a signal output by the electric current measuring instrument. The CPU judges that when the measuring instrument measures a decrease of the current value, an abnormal condition exists in the filament corresponding to the conductor with the lower current value.


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