The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Mar. 27, 2014
Applicant:

The Trustees of Columbia University IN the City of New York, New York, NY (US);

Inventors:

Dirk R. Englund, New York, NY (US);

Edward H. Chen, New York, NY (US);

Ophir Gaathon, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 24/00 (2006.01); G01N 24/10 (2006.01); G01R 33/32 (2006.01);
U.S. Cl.
CPC ...
G01N 24/006 (2013.01); G01N 21/6402 (2013.01); G01N 21/6458 (2013.01); G01N 24/10 (2013.01); G01R 33/323 (2013.01);
Abstract

Techniques for deterministic switch microscopy include resolving at least one nitrogen vacancy center in a diamond structure. A magnetic field can be applied across the diamond structure and the nitrogen vacancy centers can be optically excited. The nitrogen vacancy centers can be switched from a dark state to a bright state or a bright state by a dark state by applying at least one microwave pulse. A fluorescent response of each nitrogen vacancy center can be detected and a nitrogen vacancy center can be resolved based on the fluorescent response of each nitrogen vacancy center as it corresponds to the orientation of the nitrogen vacancy center relative to the applied magnetic field.


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