The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Jun. 10, 2014
Applicant:
General Photonics Corporation, Chino, CA (US);
Inventors:
Hongxin Chen, Chino, CA (US);
Xiaojun Chen, San Gabriel, CA (US);
Xiaotian Steve Yao, Diamond Bar, CA (US);
Assignee:
General Photonics Corporation, Chino, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/3127 (2013.01); G01M 11/3145 (2013.01);
Abstract
The disclosed technology in this patent document includes, among others, methods apparatus for distributed measuring at least one fiber bend or stress related characteristics along an optical path of fiber under test (FUT) uses both a light input unit and a light output unit connected to the FUT at one single end.
Chen, Hongxin. (2017). Distributed fiber bend and stress measurement for determining optical fiber reliability by multi-wavelength optical reflectometry (U.S. Patent No. 9632006). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9632006
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