The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Apr. 06, 2015
Applicant:

Musashi Seimitsu Industry Co., Ltd., Toyohashi-shi, Aichi, JP;

Inventors:

Shinichi Murata, Toyohashi, JP;

Yasuyoshi Matsui, Toyohashi, JP;

Shinji Ieki, Toyohashi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B21K 1/30 (2006.01); B21J 5/02 (2006.01); B21J 13/02 (2006.01);
U.S. Cl.
CPC ...
B21K 1/30 (2013.01); B21J 5/025 (2013.01); B21J 13/02 (2013.01); Y10T 29/49474 (2015.01);
Abstract

An upper die and a lower die are brought together to perform a sizing work on a roughly forged part of a primary forged article within a die cavity defined between the upper and lower dies. The lower die has a vertical through-hole directly communicated with the die cavity, and a punch is relatively movably received in the vertical through-hole in such a manner as to define jointly with the vertical through-hole an annular material flow passage. During the sizing process, a material of the roughly forge part is forced against a peripheral surface of the die cavity and excess material is allowed to flow into the annular material flow passage.


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