The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Apr. 15, 2014
Applicant:

Vital Art and Science, Llc, Richardson, TX (US);

Inventor:

Yi-Zhong Wang, Frisco, TX (US);

Assignee:

VITAL ART AND SCIENCE, LLC, Richardson, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/02 (2006.01); A61B 3/032 (2006.01); A61B 3/024 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/032 (2013.01); A61B 3/0091 (2013.01); A61B 3/024 (2013.01);
Abstract

One aspect of the disclosure includes a method to assess vision function. In one embodiment, the method comprises providing a sequence of test images on a display () to a test subject () during a stimulus interval and providing a response pattern image for each of the sequence of test images during a response interval after the stimulus interval. Each of the sequence of test images includes multiple stimulus patterns () arranged around a fixation target (). The response pattern image includes multiple response targets (), each of which corresponds to a location of each of the multiple stimulus patterns (). One () of the multiple stimulus patterns () differs. An assessment of a vision function of the test subject () is based on a selection by the test subject of one of the multiple response targets () that the test subject indicates corresponds to a location of the multiple stimulus pattern that differs (). A corresponding vision testing system () is disclosed as well.


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