The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2017
Filed:
Dec. 11, 2015
Applicants:
Carl Zeiss Meditec Ag, Jena, DE;
Carl Zeiss Ag, Oberkochen, DE;
Inventors:
Assignee:
Carl Zeiss Meditec AG, Jena, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/13 (2006.01); A61B 90/00 (2016.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/0058 (2013.01); A61B 3/102 (2013.01); A61B 3/1225 (2013.01); A61B 3/13 (2013.01); A61B 3/132 (2013.01); A61B 90/00 (2016.02);
Abstract
The present disclosure relates to a system for examining an eye. The system comprises a microscopy system for generating an image plane image of an object region. An OCT system of the system is configured to acquire OCT data from the object region which reproduce the object region in different stress states. A data processing unit of the system is configured to determine at least one value of a stress-dependent parameter, depending on the OCT data. The system generates an output image that is dependent on the image plane image and is furthermore dependent on the stress-dependent parameter.