The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Jul. 03, 2014
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Yong Ju Cho, Daejeon, KR;

Sang Woo Ahn, Daejeon, KR;

Joo Myoung Seok, Daejeon, KR;

Seong Yong Lim, Daejeon, KR;

Ji Hun Cha, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01); G03B 21/14 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3194 (2013.01); G03B 21/147 (2013.01); H04N 9/3147 (2013.01); H04N 9/3182 (2013.01);
Abstract

The present specification is related to a method for performing multi-projection and a multi-projection system for minimizing a black offset in a multi-projection environment. The present specification provides the method for performing multi-projection comprising estimating the intensity transfer function (ITF) of a plurality of projectors, calculating an optimal black offset threshold for each of the projectors by using each of the ITFs, and applying the optimal black offset threshold to an image projection by each of the projectors.


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