The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Feb. 13, 2015
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Zhou Yu, Palatine, IL (US);
Yu Zou, Naperville, IL (US);
Yuexing Zhang, Naperville, IL (US);
Xiaolan Wang, Buffalo Grove, IL (US);
TOSHIBA MEDICAL SYSTEMS CORPORATION, Otawara-shi, JP;
Abstract
A method and apparatus of aligning calibration projection data with object projection data to improve calibration corrections of the object projection data. In a first implementation, the method interpolates and upsamples both the calibration and object data, then shifts the upsampled calibration data to match a sub-view angular offset of the object data, and then performs calibration corrections before down-sampling the corrected object data. In a second implementation, the method continuously scans an object space—with the object absent (present) in the object space—to obtain calibration data (object absent) and object data (object present) both having the same sub-view angular offset. In a third implementation, the method obtains multiple scans having different sub-view angular offsets, organizes the scans into bins according to their respective sub-view angular offsets, and chooses the appropriate sub-view angular offsets bin for calibration corrections of the object data.