The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
May. 06, 2014
Applicant:
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Inventor:
Tomohiro Hoshino, Hachioji, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23293 (2013.01); H04N 5/23216 (2013.01); H04N 5/23219 (2013.01); H04N 5/23222 (2013.01); H04N 5/235 (2013.01); H04N 5/23209 (2013.01); H04N 5/23212 (2013.01); H04N 5/23245 (2013.01);
Abstract
Photographing equipment includes an image pickup unit which picks up an image of an object to obtain a picked up image, a display unit which displays the picked up image, a portion determining unit which sets an inspection area at the picked up image displayed on the display unit, an analyzing unit which analyzes at least one of an image and a setting associated with the inspection area, and a search unit which obtains a factor of a defect of the image of the inspection area by referring to a database provided in advance using an analysis result of the analyzing unit.