The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Jun. 02, 2016
Chipsea Technologies (Shenzhen) Corp., Shenzhen Guangdong, CN;
Xinjie Pang, Guangdong, CN;
CHIPSEA TECHNOLOGIES (SHENZHEN) CORP., Shenzhen, Guangdong, CN;
Abstract
A method for measuring a time delay of an OFDM cluster system includes steps of: transforming a received signal to a frequency-domain; providing channel estimation to a corresponding carrier position based on RS; providing frequency-domain interpolation channel estimation; processing the carriers of the same frequency-domain between different symbols with frequency deviation estimation, so as to obtain an angular velocity; calculating an average angular velocity; after the linear interpolation, transforming RS symbols to a time-domain, so as to obtain a crude time delay; and compensating based on the angular velocity, so as to obtain a fine time delay. For the cluster system adopting the method, the accuracy of the terminal side system time delay detection is improved, in such a manner that the availability of the terminal side automatic time delay adjustment is greatly increased, and the TA adjustment under the group calling service of the cluster system is sufficiently compensated.