The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Jan. 14, 2015
Applicant:

Sanken Electric Co., Ltd., Niiza-shi, Saitama, JP;

Inventor:

Katsuyuki Torii, Niiza, JP;

Assignee:

Sanken Electric Co., Ltd., Niiza-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/739 (2006.01); H01L 29/36 (2006.01); H01L 29/732 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7397 (2013.01); H01L 29/36 (2013.01); H01L 29/732 (2013.01); H01L 29/739 (2013.01); H01L 29/0847 (2013.01); H01L 29/1095 (2013.01);
Abstract

A semiconductor device includes: a first conductivity-type collector region; a second conductivity-type field stop region disposed on the collector region; a second conductivity-type drift region, which is disposed on the field stop region and has an impurity concentration lower than the field stop region; a first conductivity-type base region disposed on the drift region; and a second conductivity-type emitter region disposed on the base region, wherein an impurity concentration gradient in a film thickness direction of the field stop region is larger in a region adjacent to the collector region than in a region adjacent to the drift region.


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