The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Apr. 03, 2014
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventor:

Christoph Forman, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G01R 33/565 (2006.01); G01R 33/567 (2006.01); G01R 33/48 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); G01R 33/5676 (2013.01); G01R 33/56509 (2013.01); G01R 33/4826 (2013.01); G01R 33/56325 (2013.01); G06T 2211/40 (2013.01);
Abstract

In a method and apparatus for the generation of image data of a moving subject inside a body, raw data are initially acquired for a region encompassing the subject at different measurement points in time, and position overview data for the different measurement points in time are generated on the basis of at least a portion of the raw data. A scattering of the position overview data is then determined, which scattering is dependent on the measurement point in time. Spatial test regions within the position overview data are selected depending on the scattering. Trust parameter values are determined for the individual test regions, and a reconstruction of image data then takes place on the basis of the raw data under consideration of the trust parameter values of the different test regions.


Find Patent Forward Citations

Loading…