The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Apr. 14, 2015
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Chunhui Mei, San Diego, CA (US);
Tao Wang, Sunnyvale, CA (US);
Young In Yeo, Orlando, FL (US);
Vineet Goel, La Jolla, CA (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/80 (2011.01); G06T 7/00 (2017.01); G06T 1/20 (2006.01); G06T 1/60 (2006.01); G06T 13/80 (2011.01); G06T 15/00 (2011.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G06T 7/004 (2013.01); G06T 1/20 (2013.01); G06T 1/60 (2013.01); G06T 7/70 (2017.01); G06T 13/80 (2013.01); G06T 15/005 (2013.01); G06T 15/80 (2013.01); G06T 2210/12 (2013.01);
Abstract
Techniques are described for stochastic rasterization. A graphics processing unit (GPU) may discard samples of bounding polygons that together indicate movement of one or more primitives before a pixel shader process the samples. The GPU may leverage a stencil buffer and stencil test for discarding of such samples.