The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Aug. 07, 2014
System and method for the validation and quality assurance of computerized contours of human anatomy
Washington University IN St. Louis, St. Louis, MO (US);
Michael B. Altman, University City, MO (US);
Olga Green, St. Louis, MO (US);
James Kavanaugh, St. Louis, MO (US);
Hua Li, Chesterfield, MO (US);
Sasa Mutic, Creve Coeur, MO (US);
Hasani Wooten, St. Louis, MO (US);
Washington University, St. Louis, MO (US);
Abstract
A system and method for validating the accuracy of delineated contours in computerized imaging using statistical data for generating assessment criterion that define acceptable tolerances for delineated contours, with the statistical data being conditionally updated and/or refined between individual processes for validating delineated contours to thereby adjust the tolerances defined by the assessment criterion in the stored statistical data, such that the stored statistical data is more closely representative of a target population. The present invention may be used to facilitate, as one example, on-line adaptive radiation therapy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile